SHANE ELEN
Diploma Mineral Industries, G.G., F.G.A.
Summary
- 24 years characterization experience of solid state materials utilizing spectroscopy and microscopy
- Extensive spectrometry experience using WDX, EDX, SIMS, Auger, Raman, UV-Vis-NIR, FTIR, WDXRF, EDXRF, and Luminescence techniques
- Extensive microscopy experience using reflected-UV, transmitted-IR, photoluminescence, cathodoluminescence, tunneling microscopy and advanced electron imaging techniques
- Solid understanding of instrumentation and applied techniques
Education
- Diploma in Mineral Industries (Dipl. Min. Ind.) 1978 - Camborne School of Mines, Camborne, U.K.
- Graduate Gemologist Diploma (G.G.) 1996 - Gemological Institute of America, Carlsbad, CA, USA
- Gemmology Diploma, Fellowship of the Gemmological Association (F.G.A.) 1999 - Gemmological Association of Great Britain, London, U.K.
Employment History
Gemological Institute of America, Crowningshield Research Lab, Carlsbad, CA, U.S.A. (1995 – 2008) - Analytical Equipment Supervisor, Research Gemologist
Advanced characterization studies of natural, synthetic and treated gem materials
Research, develop, implement and report on advanced gemological testing techniques
Develop fast portable spectrometers for testing coloured stones and cryogenically cooled diamonds, reducing analysis time from 20-30 minutes to less than 20 seconds
Conservation Resources Inc., Seattle, WA, U.S.A. (1992 – 1994) - Vice President
Coordinated all phases of the construction of recreational suspension bridges and trails
Western Digital Semiconductor Corporation, Corporate Analytical Services, Irvine, CA, U.S.A. (1987-1992) - Supervisor of Materials Analysis, Associate-Principal Engineer
Founding member of the Material Characterization Group within Corporate Analytical Services
Designed, developed, implemented and coordinated spectrometry procedures
Supported R&D and manufacturing with materials characterization and failure analysis
Avery International Research Center, Pasadena, CA, U.S.A. (1986) - Electron Microscopist, Materials Analysis Group
Materials characterization support for R&D and production
Hi-Rel Laboratories, Monrovia, CA, U.S.A. (1981-1984) - Electron Microscopist/Member of Technical Staff, Materials Characterization Group
Materials characterization and failure analysis support for aerospace and manufacturing industries
High Duty Alloys, Technical and Research Services, Slough, U.K. (1978-1980) - Electron Microprobe Technologist, Analytical Group
Materials characterization and failure analysis support for R&D and the foundry division
Characterization Techniques
Extensive “hands-on” experience for the following instrumentation and characterization techniques:
- Scanning Electron and Field Emission Microscopy (SEM and FEM)
- Cathodoluminescence (CL), Voltage Contrast (Passive and Active), Electron Beam Induced Current (EBIC) and Magnetic Contrast advanced electron imaging techniques
- Scanning Tunneling Microscopy (STM)
- Ultraviolet Reflectance, Near Infrared Transmission and Photoluminescence Microscopy
- Electron Microprobe Wavelength Dispersive (WDX) and Energy Dispersive (EDX) Spectroscopy
- Wavelength and Energy Dispersive X-Ray Fluorescence (XRF) Spectroscopy
- Auger Electron Spectroscopy (AES)
- Secondary Ion Mass Spectrometry (SIMS)
- Raman, Photoluminescence (PL), UV-Vis-NIR and FTIR Spectroscopy
Instrumentation Training
- PHI 660 Auger/3600 SIMS subsystem training
- JEOL Wavelength Dispersive X-Ray analysis for Sesame Users
- CAMECA Camebax Microprobe Users School
Spectroscopy Short Courses
- Auger, SIMS, XPS, - PHI Workshops (Perkin Elmer)
- Trace Elemental and Surface Analysis Course - Charles Evans
- Surface Analysis: Ion Beam Spectroscopies – AVS (American Vacuum Society)
- Surface Analysis: Electron Beam Spectroscopies – AVS (American Vacuum Society)
- Compositional Depth Profiling – AVS (American Vacuum Society)
- Characterization of Films, Coatings, and Surfaces – AVS (American Vacuum Society)
- Silicon Processing for the VLSI Era –UCI extension course (University California Irvine)
Awards
- Awarded patent #6,292,315 as co-inventor of the "Gem Identification Viewer"
- 1999 2nd place Gubelin Most Valuable Article Award for "On the Identification of Various Emerald Filling Substances"
- 1997 3rd place Gubelin Most Valuable Article Award for "Gemological Properties of Near-Colorless Synthetic Diamonds"
- 1997 1st place Gubelin Most Valuable Article Award and ASAE 2nd place Best Scientific/Educational Article for "Synthetic Moissanite: A New Diamond Substitute”
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